{
  "id": "workflow:nanofabrication-process-audit",
  "_kind": "Workflow",
  "_file": "workflows/workflows/workflows-nanotech.yaml",
  "_cluster": "workflows",
  "attributes": {
    "displayName": "Nanofabrication Process Audit",
    "workflowKind": "governance",
    "triggerType": "scheduled",
    "typicalCadence": "monthly",
    "complexity": "single-team",
    "description": "Audits nanofabrication cleanroom processes for yield and\nrepeatability -- reviewing lithography overlay accuracy, etching\nuniformity across wafer maps, deposition thickness control via\nellipsometry trending, particle contamination counts, equipment PM\ncompliance, and correlating process parameter drift with device yield\nfallout. Produces corrective action requests for out-of-spec\nprocesses. Excludes process development.\n"
  },
  "outgoingEdges": [
    {
      "from": "workflow:nanofabrication-process-audit",
      "to": "role:staff-engineer",
      "kind": "involves_role",
      "attributes": {}
    },
    {
      "from": "workflow:nanofabrication-process-audit",
      "to": "role:data-scientist",
      "kind": "involves_role",
      "attributes": {}
    },
    {
      "from": "workflow:nanofabrication-process-audit",
      "to": "role:performance-profiler",
      "kind": "involves_role",
      "attributes": {}
    },
    {
      "from": "workflow:nanofabrication-process-audit",
      "to": "skill-area:observability-pipeline",
      "kind": "requires_skill_area",
      "attributes": {}
    },
    {
      "from": "workflow:nanofabrication-process-audit",
      "to": "skill-area:python-data-pipelines",
      "kind": "requires_skill_area",
      "attributes": {}
    },
    {
      "from": "workflow:nanofabrication-process-audit",
      "to": "domain:nanotechnology",
      "kind": "applies_to_domain",
      "attributes": {}
    },
    {
      "from": "workflow:nanofabrication-process-audit",
      "to": "domain:materials-science",
      "kind": "applies_to_domain",
      "attributes": {}
    },
    {
      "from": "workflow:nanofabrication-process-audit",
      "to": "responsibility:data-quality-monitoring",
      "kind": "triggers_responsibility",
      "attributes": {}
    },
    {
      "from": "workflow:nanofabrication-process-audit",
      "to": "responsibility:triage-incoming-issues",
      "kind": "triggers_responsibility",
      "attributes": {}
    },
    {
      "from": "workflow:nanofabrication-process-audit",
      "to": "org-unit:quality-engineering",
      "kind": "performed_by_org_unit",
      "attributes": {}
    },
    {
      "from": "workflow:nanofabrication-process-audit",
      "to": "org-unit:research-engineering",
      "kind": "performed_by_org_unit",
      "attributes": {}
    }
  ],
  "incomingEdges": []
}