displayName
Nano-Characterization Pipeline
workflowKind
operational
triggerType
event-driven
typicalCadence
per-sample-batch
complexity
single-team
description
Processes nanoscale characterization data through automated analysis
-- ingesting AFM topography scans, TEM/STEM micrographs, XPS
spectra, and nanoindentation curves, applying image segmentation for
particle size distribution, fitting spectral peaks for composition
analysis, computing hardness/modulus from Oliver-Pharr method, and
populating the nanomaterials property database with uncertainty
quantification. Excludes instrument operation.