skill-area:memory-usage-testing

{
  "id": "skill-area:memory-usage-testing",
  "_kind": "SkillArea",
  "_file": "domain/skill-areas/curated-mobile-skill-areas.yaml",
  "_cluster": "domain",
  "attributes": {
    "displayName": "Memory Usage Testing",
    "description": "Measuring memory footprint and leak behavior on constrained devices -\nallocation growth, lifecycle retention, and low-memory survival.\n",
    "domains": [
      "specialization:mobile-development",
      "specialization:qa-testing-automation"
    ],
    "expertiseLevels": [
      "intermediate",
      "expert"
    ]
  },
  "outgoingEdges": [
    {
      "from": "skill-area:memory-usage-testing",
      "to": "specialization:mobile-development",
      "kind": "applies_to",
      "attributes": {
        "confidence": "primary"
      }
    },
    {
      "from": "skill-area:memory-usage-testing",
      "to": "specialization:qa-testing-automation",
      "kind": "applies_to",
      "attributes": {
        "confidence": "secondary"
      }
    }
  ],
  "incomingEdges": [
    {
      "from": "page:taxonomy-alignment-import",
      "to": "skill-area:memory-usage-testing",
      "kind": "documents"
    }
  ]
}