{
  "id": "skill-area:custom-metrics-design",
  "_kind": "SkillArea",
  "_file": "domain/skill-areas/skill-areas-expanded-2.yaml",
  "_cluster": "domain",
  "attributes": {
    "displayName": "Custom Metrics Design",
    "description": "Designing application-specific metrics — choosing metric types\n(counter, gauge, histogram, summary), label cardinality management,\nnaming conventions, and business-metric instrumentation strategies.\n",
    "expertiseLevels": [
      "intermediate",
      "expert"
    ]
  },
  "outgoingEdges": [
    {
      "from": "skill-area:custom-metrics-design",
      "to": "domain:observability",
      "kind": "applies_to",
      "attributes": {
        "confidence": "primary"
      }
    },
    {
      "from": "skill-area:custom-metrics-design",
      "to": "skill-area:metrics-dashboarding",
      "kind": "prerequisite_for_learning",
      "attributes": {
        "strength": "helpful"
      }
    }
  ],
  "incomingEdges": []
}