{
  "id": "lib-skill:nanotechnology--tof-sims-analyzer",
  "_kind": "LibrarySkill",
  "_file": "generated-library/skills.yaml",
  "_cluster": "generated-library",
  "attributes": {
    "displayName": "tof-sims-analyzer",
    "description": "Time-of-Flight Secondary Ion Mass Spectrometry skill for molecular surface analysis and imaging",
    "libraryPath": "library/specializations/domains/science/nanotechnology/skills/tof-sims-analyzer/SKILL.md",
    "specialization": "nanotechnology",
    "contentSummary": "# ToF-SIMS Analyzer\n\n## Purpose\n\nThe ToF-SIMS Analyzer skill provides molecular-level surface analysis capabilities for nanomaterials, enabling identification of surface species, chemical imaging, and depth profiling with high sensitivity.\n\n## Capabilities\n\n- Molecular ion identification\n- "
  },
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