{
  "id": "lib-process:materials-science--electron-microscopy",
  "_kind": "LibraryProcess",
  "_file": "generated-library/processes.yaml",
  "_cluster": "generated-library",
  "attributes": {
    "displayName": "electron-microscopy",
    "description": "Electron Microscopy Characterization - Perform SEM/TEM analysis including imaging, EDS/WDS elemental\nmapping, EBSD orientation analysis, and microstructural quantification.",
    "libraryPath": "library/specializations/domains/science/materials-science/electron-microscopy.js",
    "specialization": "materials-science",
    "references": [
      "- SEM Imaging: https://www.thermofisher.com/us/en/home/electron-microscopy/products/scanning-electron-microscopes.html\n- TEM Techniques: https://www.jeol.co.jp/en/science/em.html\n- EBSD Analysis: https://www.oxinst.com/products/ebsd\n- EDS/WDS: https://www.bruker.com/en/products-and-solutions/elemental-analyzers/eds-wds-ebsd-sem.html"
    ],
    "example": "const result = await orchestrate('domains/science/materials-science/electron-microscopy', {\n  sampleId: 'SAMPLE-002',\n  technique: 'SEM',\n  analysisTypes: ['imaging', 'EDS', 'EBSD'],\n  magnificationRange: { min: 100, max: 50000 }\n});",
    "usesAgents": [
      "electron-microscopist",
      "microscope-operator",
      "imaging-specialist",
      "eds-analyst",
      "wds-analyst",
      "ebsd-analyst",
      "image-analyst",
      "technical-writer"
    ]
  },
  "outgoingEdges": [
    {
      "from": "lib-process:materials-science--electron-microscopy",
      "to": "skill-area:data-analysis",
      "kind": "lib_requires_skill_area",
      "attributes": {
        "weight": 1
      }
    },
    {
      "from": "lib-process:materials-science--electron-microscopy",
      "to": "skill-area:statistical-analysis",
      "kind": "lib_requires_skill_area",
      "attributes": {
        "weight": 0.7
      }
    },
    {
      "from": "lib-process:materials-science--electron-microscopy",
      "to": "skill-area:mathematical-reasoning",
      "kind": "lib_requires_skill_area",
      "attributes": {
        "weight": 0.5
      }
    },
    {
      "from": "lib-process:materials-science--electron-microscopy",
      "to": "domain:materials-science",
      "kind": "lib_applies_to_domain",
      "attributes": {
        "weight": 1
      }
    },
    {
      "from": "lib-process:materials-science--electron-microscopy",
      "to": "role:research-engineer",
      "kind": "lib_involves_role",
      "attributes": {
        "weight": 1
      }
    },
    {
      "from": "lib-process:materials-science--electron-microscopy",
      "to": "workflow:experiment-design",
      "kind": "lib_implements_workflow",
      "attributes": {
        "weight": 1
      }
    },
    {
      "from": "lib-process:materials-science--electron-microscopy",
      "to": "specialization:materials-science",
      "kind": "lib_belongs_to_specialization",
      "attributes": {
        "weight": 0.9
      }
    },
    {
      "from": "lib-process:materials-science--electron-microscopy",
      "to": "lib-agent:meta--technical-writer",
      "kind": "uses_agent",
      "attributes": {
        "weight": 0.8
      }
    }
  ],
  "incomingEdges": []
}