iiRecord
Agentic AI Atlas · emc-design-testing
lib-process:electrical-engineering--emc-design-testinga5c.ai
II.
LibraryProcess JSON

lib-process:electrical-engineering--emc-design-testing

Structured · live

emc-design-testing json

Inspect the normalized record payload exactly as the atlas UI reads it.

File · generated-library/processes.yamlCluster · generated-library
Record JSON
{
  "id": "lib-process:electrical-engineering--emc-design-testing",
  "_kind": "LibraryProcess",
  "_file": "generated-library/processes.yaml",
  "_cluster": "generated-library",
  "attributes": {
    "displayName": "emc-design-testing",
    "description": "EMC Design and Pre-Compliance Testing - Guide the design for electromagnetic compatibility and\npre-compliance testing. Covers EMI mitigation, shielding, filtering, and measurement techniques.",
    "libraryPath": "library/specializations/domains/science/electrical-engineering/emc-design-testing.js",
    "specialization": "electrical-engineering",
    "references": [
      "- CISPR 32 (Emissions for Multimedia Equipment)\n- IEC 61000 (EMC Standards Series)\n- FCC Part 15 (Radio Frequency Devices)\n- CE Marking EMC Directive Requirements"
    ],
    "example": "const result = await orchestrate('specializations/domains/science/electrical-engineering/emc-design-testing', {\n  productName: 'Industrial IoT Gateway',\n  emcRequirements: { emissionsClass: 'Class-A', immunityLevel: 'Industrial' },\n  productType: 'ITE',\n  targetMarkets: ['CE', 'FCC', 'China-CCC']\n});",
    "usesAgents": [
      "emc-engineer"
    ]
  },
  "outgoingEdges": [
    {
      "from": "lib-process:electrical-engineering--emc-design-testing",
      "to": "skill-area:hardware-abstraction-layer",
      "kind": "lib_requires_skill_area",
      "attributes": {
        "weight": 1
      }
    },
    {
      "from": "lib-process:electrical-engineering--emc-design-testing",
      "to": "skill-area:device-drivers",
      "kind": "lib_requires_skill_area",
      "attributes": {
        "weight": 0.7
      }
    },
    {
      "from": "lib-process:electrical-engineering--emc-design-testing",
      "to": "skill-area:firmware-development",
      "kind": "lib_requires_skill_area",
      "attributes": {
        "weight": 0.5
      }
    },
    {
      "from": "lib-process:electrical-engineering--emc-design-testing",
      "to": "domain:electrical-engineering",
      "kind": "lib_applies_to_domain",
      "attributes": {
        "weight": 1
      }
    },
    {
      "from": "lib-process:electrical-engineering--emc-design-testing",
      "to": "role:embedded-engineer",
      "kind": "lib_involves_role",
      "attributes": {
        "weight": 1
      }
    },
    {
      "from": "lib-process:electrical-engineering--emc-design-testing",
      "to": "role:systems-integration-engineer",
      "kind": "lib_involves_role",
      "attributes": {
        "weight": 0.7
      }
    },
    {
      "from": "lib-process:electrical-engineering--emc-design-testing",
      "to": "workflow:architecture-decision-record",
      "kind": "lib_implements_workflow",
      "attributes": {
        "weight": 1
      }
    },
    {
      "from": "lib-process:electrical-engineering--emc-design-testing",
      "to": "specialization:electrical-engineering",
      "kind": "lib_belongs_to_specialization",
      "attributes": {
        "weight": 0.9
      }
    }
  ],
  "incomingEdges": []
}