{
  "id": "lib-agent:nanotechnology--scanning-probe-specialist",
  "_kind": "LibraryAgent",
  "_file": "generated-library/agents.yaml",
  "_cluster": "generated-library",
  "attributes": {
    "displayName": "scanning-probe-specialist",
    "description": "Agent specialized in SPM techniques (AFM, STM) for nanoscale surface characterization",
    "libraryPath": "library/specializations/domains/science/nanotechnology/agents/scanning-probe-specialist/AGENT.md",
    "specialization": "nanotechnology",
    "role": "Characterization Specialist Agent",
    "expertise": [
      "Probe and mode selection",
      "Scanning parameter optimization",
      "Surface property mapping",
      "Force curve analysis",
      "Electrical characterization",
      "Data interpretation and reporting"
    ]
  },
  "outgoingEdges": [
    {
      "from": "lib-agent:nanotechnology--scanning-probe-specialist",
      "to": "skill-area:mathematical-reasoning",
      "kind": "lib_requires_skill_area",
      "attributes": {
        "weight": 1
      }
    },
    {
      "from": "lib-agent:nanotechnology--scanning-probe-specialist",
      "to": "skill-area:physics-simulation",
      "kind": "lib_requires_skill_area",
      "attributes": {
        "weight": 0.7
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    },
    {
      "from": "lib-agent:nanotechnology--scanning-probe-specialist",
      "to": "skill-area:data-analysis",
      "kind": "lib_requires_skill_area",
      "attributes": {
        "weight": 0.5
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    },
    {
      "from": "lib-agent:nanotechnology--scanning-probe-specialist",
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      "kind": "lib_applies_to_domain",
      "attributes": {
        "weight": 1
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    },
    {
      "from": "lib-agent:nanotechnology--scanning-probe-specialist",
      "to": "role:research-engineer",
      "kind": "lib_involves_role",
      "attributes": {
        "weight": 1
      }
    },
    {
      "from": "lib-agent:nanotechnology--scanning-probe-specialist",
      "to": "workflow:experiment-design",
      "kind": "lib_implements_workflow",
      "attributes": {
        "weight": 1
      }
    },
    {
      "from": "lib-agent:nanotechnology--scanning-probe-specialist",
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      "kind": "lib_belongs_to_specialization",
      "attributes": {
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  ],
  "incomingEdges": []
}